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SN74ACT8990FN 库存 & 价格

SN74ACT8990FN
显示的图像仅供参考,应从产品数据表中获得准确的规格。
SN74ACT8990FN TI
TI
  • 制造商:
    TI
  • 制造商型号#:
    SN74ACT8990FN
  • 百芯编号#:
    CM54563896
  • 价格(CNY): ¥ 170.03
  • 百芯库存:
    291
  • 可供应量:
    205 个在库
    此为供应商库存,需要与销售确认
  • 产品类别:
    逻辑,芯片
  • 产品描述:
    Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16Bit Generic Host Interfaces 44-PLCC -40℃ to 85℃
  • 文档: 符合 RoHS 标准 3D模型
SN74ACT8990FN 购买 SN74ACT8990FN 库存和价格更新于 2024-05-07 03:50:22
  • 刷新
    器件型号: SN74ACT8990FN
    百芯编号: CM54563896
    制造商: TI
    价格 ¥170.03
    总计: 496
    MOQ: 1
    库存地点: 香港
    发货日期: 2024/05/12 (预期 )
  • 购买
    *由于库存数量、价格不断波动,请 联系我们 获取型号最新价格和库存。

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    SN74ACT8990FN 规格 显示相似产品 (99+)
    类型
    描述
    选择
    制造商
    TI
    类别
    逻辑,芯片
    3D模型
     3D模型
    安装方式
    Surface Mount
    引脚数
    44 Pin
    封装
    PLCC-44
    电源电压(DC)
    4.50V ~ 5.50V
    输出电流
    8.00 mA
    位数
    16 Bit
    电压波节
    5.00 V
    工作温度(Max)
    85 ℃
    工作温度(Min)
    -40 ℃
    电源电压
    4.5V ~ 5.5V
    显示相似产品
    SN74ACT8990FN 数据规格书
    SN74ACT8990FN 数据手册Datasheet
    17 Pages, 316 KB
    查看
    尺寸 & 包装
    类型
    描述
    工作温度
    0℃ ~ 70℃
    产品生命周期
    Active
    包装方式
    Tube
    符合标准
    类型
    描述
    RoHS标准
    RoHS Compliant
    含铅标准
    Lead Free
    出口分类
    类型
    描述
    ECCN代码
    EAR99
    产品概述
    • The "ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies. The "ACT8990 differ from other SCOPETM integrated circuits. Their function is to control the JTAG serial-test bus rather than being target boundary-scannable devices.
    • The required signals of the JTAG serial-test bus - test clock (TCK), test mode select (TMS), test data input (TDI), and test data output (TDO) can be connected from the TBC to a target device without additional logic. This is done as a chain of IEEE Standard 1149.1-1990 boundary-scannable components that share the same serial-test bus. The TBC generates TMS and TDI signals for its target(s), receives TDO signals from its target(s), and buffers its test clock input (TCKI) to a test clock output (TCKO) for distribution to its target(s). The TMS, TDI, and TDO signals can be connected to a target directly or via a pipeline, with a retiming delay of up to 31 bits. Since the TBC can be configured to generate up to six separate TMS signals [TMS (5-0)], it can be used to control up to six target scan paths that are connected in parallel (i.e., sharing common TCK, TDI, and TDO signals).
    • While most operations of the TBC are synchronous to TCKI, a test-off (TOFF\\\\) input is provided for output control of the target interface, and a test-reset (TRST\\\\) input is provided for hardware/software reset of the TBC. In addition, four event [EVENT (3-0)] I/Os are provided for asynchronous communication to target device(s). Each event has its own event generation/detection logic, and detected events can be counted by two 16-bit counters.
    • The TBC operates under the control of a host microprocessor/microcontroller via the 5-bit address bus [ADRS (4-0)] and the 16-bit read/write data bus [DATA (15-0)]. Read (RD\\\\) and write (WR\\\\) strobes are implemented such that the critical host-interface timing is independent of the TCKI period. Any one of 24 registers can be addressed for read and/or write operations. In addition to control and status registers, the TBC contains two command registers, a read buffer, and a write buffer. Status of the TBC is transmitted to the host via ready (RDY\\\\) and interrupt (INT\\\\) outputs.
    • Major commands can be issued by the host to cause the TBC to generate the TMS sequences necessary to move the target(s) from any stable test-access-port (TAP) controller state to any other stable TAP state, to execute instructions in the Run-Test/Idle TAP state, or to scan instruction or test data through the target(s). A 32-bit counter can be preset to allow a predetermined number of execution or scan operations.
    • Serial data that appears at the selected TDI input (TDI1 or TDI0) is transferred into the read buffer, which can be read by the host to obtain up to 16 bits of the serial-data stream. Serial data that is transmitted from the TDO output is written by the host to the write buffer.
    • The SN54ACT8990 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ACT8990 is characterized for operation from 0°C to 70°C.
    • NC - No internal connection

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