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Application Report
SPRA713A - April 2002
1
Using Boundary Scan on the TMS320VC5441
Yi Luo
Clay Turner
VOP Platform
ABSTRACT
The TMS320VC5441 DSP (hereafter referred to as VC5441) is a quad-core processor
implementing standard IEEE 1149.1 boundary scan capability. This application report
contains a description of the VC5441 boundary scan implementation and information about
how to use it with other boundary scan tools and devices.
The material covered in this application report assumes the reader is familiar with the
boundary scan concepts defined by IEEE Standard 1149.1. An overview of these concepts
is presented in the IEEE Std 1149.1 (JTAG) Testability Primer (literature number SSYA002).
For detailed information on the operation and requirements for boundary scan, refer to the
IEEE standard itself. Copies of the standard are available from IEEE at 1-800-678-IEEE.
Contents
1 VC5441 Boundary Scan Implementation 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.1 VC5441 Silicon Revision Requirements 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.2 Full Observe and Control Capability 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.3 VC5441 Hardware Requirements for Boundary Scan Test 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.4 VC5441 Boundary Scan Pin Coverage 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.5 VC5441 Boundary Scan Description Language (BSDL) Implementation 3. . . . . . . . . . . . . . . . .
1.6 VC5441 Boundary Scan Instruction Implementation 5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
List of Figures
Figure 1. Initialization for Boundary Scan Test Mode Using TRST, EMU0 and EMU1/OFF 2. . . . . . . . . .
Figure 2. Boundary Scan Structure of the VC5441 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3. The VC5441 Subsystems Modeled as a “Module” in the Scan Chain 5. . . . . . . . . . . . . . . . . . . .
List of Tables
Table 1. Device Pins Not Testable Through Boundary Scan 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 2. Pins Captured by Each VC5441 Subsystem During Boundary Scan Test 4. . . . . . . . . . . . . . . . .
1 VC5441 Boundary Scan Implementation
1.1 VC5441 Silicon Revision Requirements
The VC5441 boundary scan implementation described in this document applies to all silicon
revisions.
