The SCANSTA111MT/NOPB is an enhanced SCAN Bridge extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment. The advantage of a multi-drop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self-test operations to be performed on one port while other scan chains are simultaneously tested.
True IEEE 1149.1 hierarchical and multidrop addressable capability
7 slot inputs support up to 121 unique addresses
3 IEEE 1149.1 Compatible configurable local scan ports
Mode register0 allows local TAPs to be bypassed
LSP ACTIVE Outputs provide local port enable signals for analogue busses supporting IEEE 1149.4
General purpose local port pass-through bits
Known power-up state
TRST on all local scan ports
32-bit TCK Counter
16-bit LFSR Signature compactor
Power-OFF high impedance inputs and outputs
Supports live insertion/withdrawal
Green product and no Sb/Br
Device has limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
