The ADR421ARZ is an ultra-precision, second generation eXtra implanted junction FET (XFET) Voltage Reference featuring low noise, high accuracy and excellent long-term stability in SOIC and MSOP footprints. Patented temperature drift curvature correction technique and XFET technology minimize nonlinearity of the voltage change with temperature. The XFET architecture offers superior accuracy and thermal hysteresis to the band gap references. It also operates at lower power and lower supply headroom than the buried Zener references. The trim terminal can also be used to adjust the output voltage over a ±0.5% range without compromising any other performance.
Low noise (0.1 to 10Hz)
3ppm/°C Low temperature coefficient
50ppm/1000 hours Long-term stability
70ppm/mA Load regulation
35ppm/V Line regulation
40ppm Typical low hysteresis
0.5mA Maximum quiescent current
10mA High output current
Product features patented or proprietary protection circuitry, damage may occur on devices subjected to high energy ESD.
