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NCN8025AMNTXG 产品设计参考

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© Semiconductor Components Industries, LLC, 2011
April, 2011 Rev. 0
1 Publication Order Number:
NCN8025AEVB/D
NCN8025AEVB
Evaluation Board Manual
for NCN8025A QFN-24
Prepared By: Philippe Andre
INTRODUCTION
This document gives a detailed description of the
NCN8025A Evaluation Board (QFN-24 version) with the
Bill Of Material (BOM), board schematic and layout. The
appropriate lab test setups are also provided. The
NCN8025A Evaluation Board has been designed to help for
a quick evaluation of the NCN8025A Compact and
Cost-Effective Smart Card Interface device.
This document has to be used with the NCN8025A
datasheet. The datasheet contains full technical details
regarding the NCN8025A specifications and operation. The
board (FR4 material) is implemented in two metal layers.
The top and bottom layers have thicknesses of 35 mm. The
PCB thickness is 1.6 mm with dimensions of 89 mm by
68 mm (see Figure 1).
Figure 1. Demo Board
EQUIPMENT
Description Main Features Example of Equipment (Note 1) Qty.
Regulated Power Supply 200 mA DC current capability Tektronix PS2520G 2
Multimeter Keitley 2000 or 2001 2
Sourcemeter Keitley 2400 1
Oscilloscope 500 MHz Bandwidth, four
channel scope, min 1 Mbit
memory per channel (Note 2)
Tecktronix TDS744, 754 or 784 / TDS5054 series or Lecroy
WR5060
TDS5104B, 1 GHz, 5GS/s
1
Voltage probe 4 probes 500 MHz Bandwidth Tektronix or Lecroy 4
Waveform generator Pattern genarator Agilent 81104A 80 MHz or HP8110A 150 MHz 2 outputs 1
SMB Cable External Clock Input 1
1. Equipment used in the context of this Application Note Manual.
2. Greater Scope memory per channel offers better resolution.
http://onsemi.com
EVALUATION BOARD MANUAL
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