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© Semiconductor Components Industries, LLC, 2015
July, 2015 − Rev. 0
1 Publication Order Number:
EVBUM2305/D
NB7V52MMNGEVB
NB752MMNGEVB
Evaluation Board
User's Manual
Introduction
ON Semiconductor has developed the QFN16EVB evaluation
board for its high-performance devices packaged in the 16-pin QFN.
This evaluation board was designed to provide a flexible and
convenient platform to quickly evaluate, characterize and verify the
operation of various ON Semiconductor products. Many QFN16EVBs
are dedicated with a device already installed, and can be ordered from
www.onsemi.com
at the specific device web page.
Evaluation Board Manual Contents:
• Information on16-Lead QFN Evaluation Board
• Assembly Instructions
• Appropriate Lab Setup
• Board Schematic
• Bill of Materials
This user’s manual provides detailed information on board contents,
layout and its use. This manual should be used in conjunction with
NB7V52M data sheet which contains full technical details on the
device specifications and operations.
Board Layout
The QFN16 Evaluation Board provides a high bandwidth, 50 W
controlled impedance environment and is implemented in four layers.
The first layer or primary trace layer is 0.008″ thick Rogers RO4003
material, and is designed to have equal electrical length on all signal
traces from the device under test (DUT) pins to the SMA connectors.
The second layer is the 1.0 oz copper ground plane and is primarily
dedicated for the SMA connector ground plane. FR4 dielectric
material is placed between the second and third layers and between
third and fourth layers. The third layer is also 1.0 oz copper plane.
A portion of this layer is designated for the device VCC and
DUTGND power planes. The fourth layer is the secondary trace layer.
www.onsemi.com
EVAL BOARD USER’S MANUAL
Figure 1. NB7V52MMNGEVB Evaluation
Board (Top View)
Figure 2. NB7V52MMNGEVB Evaluation
Board (Bottom View)
