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Texas Instruments, Inc
12500 TI Boulevard, MS 8640, Dallas, Texas 75243
LM358 AND LM2904 APPLICATION ALERT
Date: 10/20/2006
To: PCN Avnet
Dear Customer:
Texas Instruments announced qualification of a new die revision for the LM358 and
LM2904 on Feb 8, 2006 via PCN20060206000. Analysis of this new die revision (rev.
F) reveals that the die has unbalanced transistor gains as a result of the redesign.
This unbalance causes the slew rate at the unity gain to be slower than the previous
die revision (rev. E).
As a result, oscillation could potentially occur in applications where the device output
drives heavy capacitive loads, such as the gate of a MOSFET. While this issue is
application specific and only a few applications where slew rate is critical could
experience this effect, Texas Instruments has put the E die revision back into
production until further notice.
Devices with date codes 0619 through 0642 were built using the F die revision. If
you’ve qualified the F die revision material and are using it successfully then no
action is required. If you use the device in an application as described above or
you’ve experienced oscillation issues, you may return the units to Texas
Instruments for replacement with material built using the E die revision. Lead times
for replacement material could apply as the previous die revision is ramped to
production.
We apologize for this inconvenience and we stand ready to work with you to
minimize any problems this issue might cause. Feel free to contact us at the
numbers listed below, or your field sales representative, if you need more
information.
Sincerely,
Sam Rizzo
Standard Linear and Logic
Email: s-rizzo2@ti.com
Phone: (903) 868-7063
For further information, contact:
Joey Gooch
Email: j-gooch@ti.com
Phone: (903) 868-6128
